Low-Cost Active Monitoring of Attendance using Passive RFID Technology

Authors

  • Wael A Farag American University of the Middle East
  • Mohamed Abouelela American University of the Middle East

DOI:

https://doi.org/10.26555/jiteki.v8i4.25168

Keywords:

Attendance, RFID, Internet of Things, School Safety, Education, IoT

Abstract

In this paper, a smart attendance system for students attending schools is proposed. The proposed attendance system is based on Radio Frequency Identification (RFID) technology to facilitate automation and convenience. The proposed RFID Attendance System (RFID-AS) should be used by school administration to ensure safety for students as well as using it for grading and evaluation purposes. After careful study, passive RFID technology is selected to be used by the proposed system for its reasonable cost. The main components of the system are an RFID tag, an RFID reader, Visual Studio (XAF Tool), and SQL Server to compare the data from the RFID tag with the students’ database to record attendance automatically. A Graphical User Interface (GUI) is developed using Visual Studio (XAF Tool) to allow parents and school faculty to log in and browse the students’ records. Students will pass the classroom door, which will have an integrated RFID reader device to read their RFID. The paper discusses the design of the solution as well as the testing scenarios.

Author Biography

Wael A Farag, American University of the Middle East

Wael Farag earned his Ph.D. from the University of Waterloo, Canada in 1998; M.Sc. from the University of Saskatchewan, Canada in 1994; and B.Sc. from Cairo University, Egypt in 1990. His research, teaching and industrial experience focus on embedded systems, mechatronics, autonomous vehicles, renewable energy, and control systems. He has combined 17 years of industrial and senior management experience in Automotive (Valeo), Oil & Gas (Schneider) and Construction Machines (CNH) positioned in several countries including Canada, USA & Egypt. Moreover, he has 10 Years of the academic experience at Wilfrid Laurier University, Cairo University, and the American University of the Middle East. Spanning several topics of electrical and computer engineering. He is the holder of 2 US patents; IEEE Senior member, ISO9000 Lead Auditor Certified and Scrum Master Certified.

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Published

2022-12-21

How to Cite

[1]
W. A. Farag and M. Abouelela, “Low-Cost Active Monitoring of Attendance using Passive RFID Technology”, J. Ilm. Tek. Elektro Komput. Dan Inform, vol. 8, no. 4, pp. 552–564, Dec. 2022.

Issue

Vol. 8 No. 4 (2022): Desember

Section

Articles

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