Ali M, Azam MS, Shahzad T. Random Search-Based Parameter Optimization on Binary Classifiers for Software Defect Prediction. J. Ilm. Tek. Elektro Komput. Dan Inform [Internet]. 2024 Jul. 15 [cited 2024 Nov. 21];10(2):476-88. Available from: https://journal.uad.ac.id/index.php/JITEKI/article/view/28973