ALSAYGH, Zaid Natiq; AL-AMEEN, Zohair. Adapted Generalized Unsharp Masking Algorithm for Sharpness Improvement of Scanning Electron Microscopy Images. Jurnal Ilmiah Teknik Elektro Komputer dan Informatika, [S. l.], v. 8, n. 3, p. 342–353, 2022. DOI: 10.26555/jiteki.v8i3.24179. Disponível em: https://journal.uad.ac.id/index.php/JITEKI/article/view/24179. Acesso em: 15 jan. 2025.